{"title":"3D FEM simulation of small stripline for EMC testing","authors":"K. Zdeněk, S. Jiří, D. Nikolayev","doi":"10.1109/AE.2014.7011691","DOIUrl":null,"url":null,"abstract":"This paper overviews the measurement and simulation of the electric parameters of a small stripline. The stripline was designed and built for electromagnetic compatibility (EMC) testing of small electronic devices with the accent on electromagnetic immunity (EMI) testing. The paper describes the measurement of electric field inside the stripline in an anechoic chamber and the simulation using parametric 3D finite element method (FEM) model that confirms the measurement results. The simulation results demonstrate also the usable area inside the stripline for EMI testing.","PeriodicalId":149779,"journal":{"name":"2014 International Conference on Applied Electronics","volume":"34 5","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 International Conference on Applied Electronics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AE.2014.7011691","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
This paper overviews the measurement and simulation of the electric parameters of a small stripline. The stripline was designed and built for electromagnetic compatibility (EMC) testing of small electronic devices with the accent on electromagnetic immunity (EMI) testing. The paper describes the measurement of electric field inside the stripline in an anechoic chamber and the simulation using parametric 3D finite element method (FEM) model that confirms the measurement results. The simulation results demonstrate also the usable area inside the stripline for EMI testing.
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