{"title":"OPF governed determination of location and size of distribution generators using gravitational search algorithm","authors":"B. K. Sarkar, A. Chakrabarti","doi":"10.1109/CIEC.2016.7513766","DOIUrl":null,"url":null,"abstract":"In the electricity pricing, the congestion management has become extremely important and it can impose unavoidable problems in electricity trading. In this paper, Gravitational Search Algorithm (GSA) based optimization is performed to address the optimal power flow (OPF) problem governed by contribution factor based ranking and nodal congestion price based ranking in order to achieve congestion relief and maximum economic benefit with desired voltage level and minimum system loss. The methodology has been tested on a typical IEEE test system.","PeriodicalId":443343,"journal":{"name":"2016 2nd International Conference on Control, Instrumentation, Energy & Communication (CIEC)","volume":"56 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 2nd International Conference on Control, Instrumentation, Energy & Communication (CIEC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CIEC.2016.7513766","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
In the electricity pricing, the congestion management has become extremely important and it can impose unavoidable problems in electricity trading. In this paper, Gravitational Search Algorithm (GSA) based optimization is performed to address the optimal power flow (OPF) problem governed by contribution factor based ranking and nodal congestion price based ranking in order to achieve congestion relief and maximum economic benefit with desired voltage level and minimum system loss. The methodology has been tested on a typical IEEE test system.
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