{"title":"Built-In Hardware for Analog Circuitry Testing","authors":"M. Assaf, M. Fathi","doi":"10.1109/CERMA.2008.7","DOIUrl":null,"url":null,"abstract":"Testing analog circuits is a challenging endeavor. The subject paper investigates the oscillation-based built-in self-test (OBIST) technique for testing the analog circuits. An analog circuit-testing environment based on the OBIST method is considered and implemented.Experimental results show that OBIST is a promising testing method for analog circuits which neither requires a stimulus generator nor a complex result analyzer.","PeriodicalId":126172,"journal":{"name":"2008 Electronics, Robotics and Automotive Mechanics Conference (CERMA '08)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-09-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 Electronics, Robotics and Automotive Mechanics Conference (CERMA '08)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CERMA.2008.7","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8
Abstract
Testing analog circuits is a challenging endeavor. The subject paper investigates the oscillation-based built-in self-test (OBIST) technique for testing the analog circuits. An analog circuit-testing environment based on the OBIST method is considered and implemented.Experimental results show that OBIST is a promising testing method for analog circuits which neither requires a stimulus generator nor a complex result analyzer.
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