A life evaluation method of film capacitor using accelerated life testing

Abstract

With the rapid development of science and technology, and the continuous improvement of industrial manufacturing and reliability, the quantitative assessment of reliability and life is very important. As a kind of high-reliability and long-life product, film capacitor is widely used in communication, locomotive, and wind power generation, etc. Such a situation presents higher requirements for the life assessment method of film capacitors. Generally, we use the method of accelerated life testing for the evaluation of the product life of high-reliability and long-life. In order to assess the life of the film capacitor effectively and accurately, then further study the life situation of the system which film capacitor in, this paper is based on the cumulative failure model, through the analysis of the film capacitor failure conditions. What's more, this paper determines the lifetime distribution and acceleration model. Then optimizes accelerated life testing by using genetic algorithm and D-optimal. At last, Monte Carlo simulation is used to verify the testing optimum design.