{"title":"In-line continuity and in-line DF wire testing","authors":"J. A. Whitney","doi":"10.1109/EEIC.1999.826175","DOIUrl":null,"url":null,"abstract":"This paper provides a comparison of benchtop sampling versus continuous in-line testing for film continuity and for dielectric dissipation factor in magnet wire. Specification changes which are needed to secure close correlation are discussed.","PeriodicalId":415071,"journal":{"name":"Proceedings: Electrical Insulation Conference and Electrical Manufacturing and Coil Winding Conference (Cat. No.99CH37035)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings: Electrical Insulation Conference and Electrical Manufacturing and Coil Winding Conference (Cat. No.99CH37035)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EEIC.1999.826175","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper provides a comparison of benchtop sampling versus continuous in-line testing for film continuity and for dielectric dissipation factor in magnet wire. Specification changes which are needed to secure close correlation are discussed.
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