{"title":"High speed ring generators and compactors of test data [logic IC test]","authors":"Grzegorz Mrugalski, J. Rajski, J. Tyszer","doi":"10.1109/VTEST.2003.1197633","DOIUrl":null,"url":null,"abstract":"This paper presents a new highly modular architecture of generators and compactors of test patterns. This structure has fewer levels of logic, smaller fan-out, reduced area, and operates at faster speed than external feedback LFSRs, internal feedback LFSRs, and cellular automata, all implementing the same characteristic polynomial.","PeriodicalId":292996,"journal":{"name":"Proceedings. 21st VLSI Test Symposium, 2003.","volume":"34 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"29","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. 21st VLSI Test Symposium, 2003.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTEST.2003.1197633","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 29
Abstract
This paper presents a new highly modular architecture of generators and compactors of test patterns. This structure has fewer levels of logic, smaller fan-out, reduced area, and operates at faster speed than external feedback LFSRs, internal feedback LFSRs, and cellular automata, all implementing the same characteristic polynomial.
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