{"title":"A proposed ATE for digital systems","authors":"E. Saad, I.E. Talkhan, I. M. Sayed","doi":"10.1109/NRSC.1996.551113","DOIUrl":null,"url":null,"abstract":"An ATE-system that can perform digital system testing to localize the faulty part is developed. The test system strategy is based on system and/or board partitioning and hierarchical testing. Testing takes place automatically by software programs within complete test packages including test models, test simulation, fault detection and fault diagnosis.","PeriodicalId":127585,"journal":{"name":"Thirteenth National Radio Science Conference. NRSC '96","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"1996-03-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Thirteenth National Radio Science Conference. NRSC '96","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NRSC.1996.551113","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8
Abstract
An ATE-system that can perform digital system testing to localize the faulty part is developed. The test system strategy is based on system and/or board partitioning and hierarchical testing. Testing takes place automatically by software programs within complete test packages including test models, test simulation, fault detection and fault diagnosis.
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