S. Kopp, B. Baller, S. Childress, R. Ford, D. Harris, D. Indurthy, C. Kendziora, C. Moore, Z. Pavlovic, M. Proga, G. Tassotto, R. Zwaska
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引用次数: 3
Abstract
We present recent beam data from a new design of a profile monitor for proton beams at Fermilab. The monitors, consisting of grids of segmented Ti foils 5 /spl mu/m thick, are secondary-electron emission monitors (SEM's). We review data on the device's precision on beam centroid position, beam width, and on beam loss associated with the SEM material placed in the beam.
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