{"title":"Cloud based system for measurement data management in large scale electronic production","authors":"L. Angrisani, G. Ianniello, A. Stellato","doi":"10.1109/EMTC.2014.6996651","DOIUrl":null,"url":null,"abstract":"In this paper, a novel measurement data management system, based on cloud technology, is proposed. The system aims at maximizing the potential of the information assets of large electronic manufacturing companies through the collection, management and analysis of the so called Big Data generated by means of test processes, performed during the life-cycle of the products.","PeriodicalId":178778,"journal":{"name":"2014 Euro Med Telco Conference (EMTC)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 Euro Med Telco Conference (EMTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMTC.2014.6996651","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
In this paper, a novel measurement data management system, based on cloud technology, is proposed. The system aims at maximizing the potential of the information assets of large electronic manufacturing companies through the collection, management and analysis of the so called Big Data generated by means of test processes, performed during the life-cycle of the products.
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