SNOM probes: fabrication and application for local modification of surface

V. F. Dryakhlushin, V. Veiko
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Abstract

The probe is a key element of a SNOM. The probe size determines the microscope resolution, the optical power emerging from the probe determines applications of SNOM for local surface modification and high-resolution diagnostics. Two methods of fabrication of SNOM probes are developed in this report - the method of chemical etching of optical fiber and method of controlled mechanical pulling with laser heating of optical fiber ("laser pooling")
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SNOM探针:表面局部修饰的制造与应用
探针是SNOM的关键元件。探针的尺寸决定了显微镜的分辨率,从探针产生的光功率决定了SNOM在局部表面修饰和高分辨率诊断方面的应用。本文提出了两种制备SNOM探针的方法——光纤的化学蚀刻法和激光加热光纤的可控机械拉拔法(“激光池”)。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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