Effects of texture on the properties of polycrystalline HgI2 films

W. Shi, Q. Su, Dongming Li, Linjun Wang, Haokun Hu, Yiben Xia
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Abstract

Due to different oriented polycrystalline HgI2 films show different properties. In this paper the properties of different oriented HgI2 films have been investigated by scanning electron microscopy, X-ray diffraction and current-voltage measurements. The measured results indicate HgI2 films are of high quality and the properties of the (001)-oriented HgI2 film are better than those of the free oriented ones. The dark current of the (001)-oriented HgI2 film is 0.5 nA with an applied bias voltage of 40 V. The current of (001)-oriented HgI2 film keeps unchanged during measurement.
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织构对多晶HgI2薄膜性能的影响
由于取向不同,多晶HgI2薄膜表现出不同的性能。本文采用扫描电镜、x射线衍射和电流-电压测量等方法研究了不同取向的HgI2薄膜的性能。实验结果表明,(001)取向的HgI2薄膜质量高,性能优于自由取向的HgI2薄膜。(001)取向HgI2薄膜的暗电流为0.5 nA,外加偏置电压为40 V。(001)取向HgI2薄膜的电流在测量过程中保持不变。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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