{"title":"Comparison of electric field strength at VHF frequencies generated by dipoles and TEM cells","authors":"Tian Hong Loh, B. Loader, M. Alexander","doi":"10.1109/EMCZUR.2007.4388281","DOIUrl":null,"url":null,"abstract":"The results are presented of an intercomparison of electric field strength generated by calculable dipoles and transverse electromagnetic (TEM) cells from 30 MHz to 100 MHz. An optical electric field sensor (OEFS) is used as the transfer device between an open-area test site (OATS) and two TEM cells. The corresponding calibration factors for the OEFS are measured and compared. The agreement of better than 0.4 dB between the calibration factors obtained in the different facilities gives confidence in the basis of two distinct methods that provide traceability for E-field strength, namely the calculable dipole and the TEM cell.","PeriodicalId":397061,"journal":{"name":"2007 18th International Zurich Symposium on Electromagnetic Compatibility","volume":"39 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 18th International Zurich Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMCZUR.2007.4388281","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
The results are presented of an intercomparison of electric field strength generated by calculable dipoles and transverse electromagnetic (TEM) cells from 30 MHz to 100 MHz. An optical electric field sensor (OEFS) is used as the transfer device between an open-area test site (OATS) and two TEM cells. The corresponding calibration factors for the OEFS are measured and compared. The agreement of better than 0.4 dB between the calibration factors obtained in the different facilities gives confidence in the basis of two distinct methods that provide traceability for E-field strength, namely the calculable dipole and the TEM cell.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
