A Novel Design to Obtain Fault Tolerant Majority Gate for Five Input Majority Gate by Quantum Cellular Automata

Dhrubajyoti Bhowmik, Apu Saha, P. Dutta
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引用次数: 5

Abstract

Quantum-dot Cellular Automata (QCA) is a standout amongst the most alluring advances for figuring at nanoscale. The rule component in Quantum Cellular Automata is a majority gate. In this paper, fault-tolerance properties of the 5 input majority gate is studied. This segment is appropriate for outlining fault-tolerant Quantum Cellular Automata circuits. We examine fault-tolerance properties of three-input majority gate in terms of misalignment, missing, and dislocation cells. In order to authenticate the functionality of the suggested element some physical verifications using kink energy and computer simulations using QCA Designer tool are performed. Our outcomes plainly demonstrate that the excess variant of the majority gate is stronger than the standard style for this gate.
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基于量子元胞自动机的五输入多数门容错多数门设计
量子点元胞自动机(Quantum-dot Cellular Automata, QCA)是纳米尺度计算中最具吸引力的进步之一。量子元胞自动机中的规则组件是多数门。本文研究了5输入多数门的容错特性。本节适用于概述容错量子元胞自动机电路。我们研究了三输入多数门的容错特性,包括错位、缺失和错位单元。为了验证所建议元素的功能,使用扭结能量进行了一些物理验证,并使用QCA Designer工具进行了计算机模拟。我们的结果清楚地表明,多数门的多余变体比该门的标准样式更强。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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