Compressed sensing approach for reflectarray diagnostic from far field measurements

Abstract

A compressed sensing based approach is proposed in order to diagnose reflectarrays from far field measurements. The technique requires the preliminary measurement of the failure-free reflectarray. With this a priori knowledge, only the faulty elements have to be retrieved which leads to a significant reduction of required measurement data compared to conventional approaches. The proposed approach is applied to post-process measured reflectarray far field data and the diagnostic results are compared to those obtained by the standard back-propagation technique and an inversion matrix method.