{"title":"A 60GHz CMOS transceiver considering HCI reliability","authors":"K. Okada","doi":"10.1109/RFIT.2015.7377874","DOIUrl":null,"url":null,"abstract":"This paper presents a hot-carrier injection (HCI) healing technique with a 60GHz wireless transceiver in 65nm CMOS. The transceiver is capable of 16QAM wireless communication with a data rate of 7Gb/s. The damaged output power can be recovered to 7.8dBm by the proposed HCI-healing technique, and an 81-year lifetime is achieved.","PeriodicalId":422369,"journal":{"name":"2015 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT)","volume":"113 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RFIT.2015.7377874","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
This paper presents a hot-carrier injection (HCI) healing technique with a 60GHz wireless transceiver in 65nm CMOS. The transceiver is capable of 16QAM wireless communication with a data rate of 7Gb/s. The damaged output power can be recovered to 7.8dBm by the proposed HCI-healing technique, and an 81-year lifetime is achieved.
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