A 0.6 V 2.7 mW 94.3% locking range injection-locked frequency divider using modified varactor-less Colpitts oscillator topology

IF 1 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC Iet Circuits Devices & Systems Pub Date : 2021-03-17 DOI:10.1049/cds2.12056
Zhen Li, Zhenrong Li, Xing Quan, Zeyuan Wang, Xinyu Li, Yiqi Zhuang
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引用次数: 1

Abstract

This study presents a 4.6–12.8 GHz injection-locked frequency divider (ILFD) based on modified varactor-less Colpitts oscillator topology. A modified Colpitts ILFD is proposed to improve the LR and reduces power consumption, simultaneously. Meanwhile, the forward body bias technique is utilized to further decrease power consumption. Based on the 55 nm CMOS technology, a modified varactor-less Colpitts ILFD with a free-running frequency of 4.05 GHz is implemented. The proposed modified varactor-less Colpitts ILFD exhibits 94.3% LR from 4.6 to 12.8 GHz with an injection power of 0 dBm. It consumes 2.7 mW power from 0.6 V supply voltage and the core area is 0.38 mm2.

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一种0.6 V 2.7 mW锁定范围94.3%的注入锁定分频器,采用改进的无变元Colpitts振荡器拓扑结构
本文提出了一种基于改进无变元Colpitts振荡器拓扑结构的4.6-12.8 GHz注入锁定分频器(ILFD)。提出了一种改进的Colpitts ILFD,以提高LR并同时降低功耗。同时,利用前向体偏置技术进一步降低功耗。基于55 nm CMOS技术,实现了一种自由工作频率为4.05 GHz的改进无变容Colpitts ILFD。提出的改进的无变元Colpitts ILFD在4.6 - 12.8 GHz范围内具有94.3%的LR,注入功率为0 dBm。电源电压为0.6 V,功耗为2.7 mW,核心面积为0.38 mm2。
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来源期刊
Iet Circuits Devices & Systems
Iet Circuits Devices & Systems 工程技术-工程:电子与电气
CiteScore
3.80
自引率
7.70%
发文量
32
审稿时长
3 months
期刊介绍: IET Circuits, Devices & Systems covers the following topics: Circuit theory and design, circuit analysis and simulation, computer aided design Filters (analogue and switched capacitor) Circuit implementations, cells and architectures for integration including VLSI Testability, fault tolerant design, minimisation of circuits and CAD for VLSI Novel or improved electronic devices for both traditional and emerging technologies including nanoelectronics and MEMs Device and process characterisation, device parameter extraction schemes Mathematics of circuits and systems theory Test and measurement techniques involving electronic circuits, circuits for industrial applications, sensors and transducers
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