Analyzing Minimal Failure-Causing Schemas in Siemens Suite

Chiya Xu, Yuanchao Qi, Ziyuan Wang, Weifeng Zhang
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引用次数: 5

Abstract

Combinatorial testing has been widely utilized in testing softwares, e.g. Siemens Suite. This paper aims to investigate the reason why combinatorial testing works in Siemens Suite. Experiments are designed to get the MFS(minimal failure-causing schema) for Siemens Suite, which has been used as a benchmark to evaluate the effectiveness of many testing techniques. The lowerbound of fault-detecting probability of T-way combinatorial test suite for each program is calculated by analyzing the strengths and the number of MFS for each faulty version. Computational results could explain the effectiveness of combinatorial testing in Siemens Suite.
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分析Siemens Suite中的最小故障导致模式
组合测试在测试软件中得到了广泛的应用,例如Siemens Suite。本文旨在探讨组合测试在Siemens Suite中行得通的原因。为了得到Siemens Suite的MFS(最小故障导致模式),设计了实验,MFS已被用作评估许多测试技术有效性的基准。通过分析各故障版本的MFS的强度和个数,计算出各程序T-way组合测试套件的故障检测概率下界。计算结果可以解释Siemens Suite组合测试的有效性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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