EVALUATION OF WOOD SURFACE ROUGHNESS BY CONFOCAL MICROSCOPY

Endre Magoss, R. Rozs, S. Tatai
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引用次数: 1

Abstract

The main aim of this study is to define the usability of the confocal scanning optical microscope (CSOM) to evaluate the wood surface roughness. Therefore, systematic investigation was carried out to define the influences of CSOM on the acquisition of 2D surface roughness parameters. Mahr Perthometer was applied to get reference data to estimatetheapplicability of the CSOM. Because wood roughness parameters measured with stylus and optical methods are not always comparable a calibration method was conducted on a metal calibration etalon. After the calibration process, the roughness profiles taken with the optical and stylus units were much closer to each other and only the optical Rpkparameter was definitely higher due to artificial peaks generated by the optical system. In order to eliminate this measuringfailure, the morphological filter option of the optical apparatus may be activated. Thesurface roughness parameters were measured on planed Scotch pine samples. The planed surface plains were produced with 0.2 mm parallel offset to investigate thestructural influence of the single cutting plains. The obtained results show that the average values for Ra, Rq, Rz, Rk, and Rvkare close to each other for both measuring systems, only theoptically measured Rpkvalues must be corrected. The standard deviations, however, are systematically slightly higher for optical system. This may be explained by the higher resolution of the optical system giving more fine profile details. The earlier developed and introduced dimensionless quantities, such as Abbott ratio, are also fully comparable for both systems provided that the optically measured Rpkvalues are also correct.
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用共聚焦显微镜评价木材表面粗糙度
本研究的主要目的是确定共聚焦扫描光学显微镜(CSOM)评估木材表面粗糙度的可用性。因此,系统地研究了CSOM对获取二维表面粗糙度参数的影响。利用Mahr温度计获取参考数据,对CSOM的适用性进行了评价。由于用手写笔和光学方法测量的木材粗糙度参数并不总是具有可比性,因此对金属校准标准龙进行了校准方法。校正过程后,光学单元和触控笔单元的粗糙度曲线更加接近,只有光学Rpkparameter由于光学系统产生的人为峰而明显升高。为了消除这种测量失败,可以激活光学装置的形态滤波器选项。对刨平后的苏格兰松样品进行了表面粗糙度参数测量。以平行偏移量0.2 mm的平面平原为研究对象,研究单次切割平原对结构的影响。结果表明,两种测量系统的Ra、Rq、Rz、Rk和rvkk的平均值非常接近,只需要对光学测量的rpk值进行校正。然而,光学系统的标准偏差略高。这可能是由于光学系统的高分辨率提供了更精细的轮廓细节。如果光学测量的rpk值也是正确的,那么早期开发和引入的无因次量,如Abbott比率,对于两个系统也是完全可比的。
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