Convergence Properties of Surface Conductivity Characterization Method for Thin Conductive Strips

M. Shahpari, C. Fumeaux, D. Thiel
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Abstract

A new method to measure the surface conductivity $\sigma_{s}$ of thin conductors has been recently proposed, that requires placement of a narrow strip inside a rectangular waveguide. Infinite series appear in the calculations required to extract $\sigma_{s}$ from the measured scattering parameters. In this paper, we explore the convergence of the different series that are associated with two choices of basis functions (uniform & cosh). We also show the impact of the series truncation on the final computed values of the complex surface conductivity of 10-$j$ 10mS=Sq at 10GHz.
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薄导电带表面电导率表征方法的收敛性
最近提出了一种测量薄导体表面电导率的新方法,该方法需要在矩形波导中放置窄条。从测量的散射参数中提取$\sigma_{s}$所需的计算中出现无穷级数。在本文中,我们探讨了与两种基函数(一致和cosh)相关联的不同级数的收敛性。我们还展示了串联截断对10GHz下10-$j$ 10mS=Sq的复杂表面电导率的最终计算值的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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