A. Cavalleri, K. Sokolowski-Tinten, J. Bialkowski, D. von der Linde
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引用次数: 0
Abstract
Time of flight (TOF) distributions of evaporated particles from the surface of GaAs have been measured in order to determine its maximum temperature during femtosecond irradiation (100 fs, 620 nm). A quadrupole mass spectrometer (QMS) provides the TOF distribution of a given particle mass after laser excitation.
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