{"title":"Error value driven fault analysis attack","authors":"M. Yoshikawa, Hikaru Goto, K. Asahi","doi":"10.1109/SNPD.2014.6888689","DOIUrl":null,"url":null,"abstract":"The advanced encryption standard (AES) has been sufficiently studied to confirm that its decryption is computationally impossible. However, its vulnerability against fault analysis attacks has been pointed out in recent years. To verify the vulnerability of electronic devices in the future, into which cryptographic circuits have been incorporated, fault Analysis attacks must be thoroughly studied. The present study proposes a new fault analysis attack method which utilizes the tendency of an operation error due to a glitch. The present study also verifies the validity of the proposed method by performing evaluation experiments using FPGA.","PeriodicalId":272932,"journal":{"name":"15th IEEE/ACIS International Conference on Software Engineering, Artificial Intelligence, Networking and Parallel/Distributed Computing (SNPD)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"15th IEEE/ACIS International Conference on Software Engineering, Artificial Intelligence, Networking and Parallel/Distributed Computing (SNPD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SNPD.2014.6888689","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

The advanced encryption standard (AES) has been sufficiently studied to confirm that its decryption is computationally impossible. However, its vulnerability against fault analysis attacks has been pointed out in recent years. To verify the vulnerability of electronic devices in the future, into which cryptographic circuits have been incorporated, fault Analysis attacks must be thoroughly studied. The present study proposes a new fault analysis attack method which utilizes the tendency of an operation error due to a glitch. The present study also verifies the validity of the proposed method by performing evaluation experiments using FPGA.
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错误值驱动的故障分析攻击
对高级加密标准(AES)进行了充分的研究,证实其解密在计算上是不可能的。然而,近年来人们指出了它在故障分析攻击中的脆弱性。为了在未来验证电子设备的脆弱性,必须深入研究故障分析攻击。本研究提出了一种新的故障分析攻击方法,该方法利用故障导致操作错误的倾向。本研究还通过FPGA进行了评估实验,验证了所提方法的有效性。
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