The effect of aging process on the parameters of a thin film optoelectronic NAND logical gate

Z. Porada
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Abstract

An optoelectronic logical gate NAND composed of thin film photoconductive (PC) and electroluminescent (EL) elements. In the system was supplied with sinusoidal voltage with equal values of amplitude and frequency. The input signals were two rectangular light pulses, illuminating the respective photoconductive elements, and the output signal was the luminance of the electro-luminescent cell. The process of natural aging, which caused changes in parameters of PC elements, influenced also the changes in characteristics of the system composed of these elements. For EL element subjected to aging in normal conditions without applied voltage, the luminance of the light was lower by about 20% than for element immediately after their preparation. A variation of the parameters of PC and EL elements by the aging process caused then a decrease of the signal on the output of NAND gate and also an increase in the lag of the output signal in relation to the input signal.
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老化过程对薄膜光电NAND逻辑门参数的影响
一种由薄膜光导(PC)和电致发光(EL)元件组成的光电逻辑门NAND。系统由幅值和频率相等的正弦电压供电。输入信号为两个矩形光脉冲,分别照亮各自的光导元件,输出信号为电致发光电池的亮度。自然老化过程引起PC元件参数的变化,也影响了由这些元件组成的系统特性的变化。在无外加电压的正常条件下老化的EL元件,其发光亮度比刚制备后的元件低20%左右。老化过程导致PC和EL元件参数的变化,导致NAND门输出信号减小,输出信号相对于输入信号的滞后增大。
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