{"title":"Revisiting delay variations statistically through an example","authors":"Valeriu Beiu, M. Tache","doi":"10.1109/SMICND.2015.7355200","DOIUrl":null,"url":null,"abstract":"This paper details preliminary results for a novel statistical analysis, using the delay of an inverter (the basic element of SRAM cells) as an example. The results obtained are statistically meaningful, and should allow for more accurate, faster, and better yield estimates.","PeriodicalId":325576,"journal":{"name":"2015 International Semiconductor Conference (CAS)","volume":"69 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 International Semiconductor Conference (CAS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMICND.2015.7355200","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper details preliminary results for a novel statistical analysis, using the delay of an inverter (the basic element of SRAM cells) as an example. The results obtained are statistically meaningful, and should allow for more accurate, faster, and better yield estimates.
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