New Technique for Fault Detection in Quantum Cellular Automata

Binu K. Mathew, Shajimon K. John, C. Pradeep
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引用次数: 6

Abstract

Quantum cellular automata (QCA) circuits, the new generation nanotechnology with wide attention in recent years. In this we are proposing a framework based on QCA for finding out the stuck-at fault of a circuit. The existing technologies and methods are not guaranteed to detect the stuck-at faults. This work is motivated by the fact that the stuck-at fault test set of a circuit is not guaranteed to detect all defects that can occur in its QCA implementation.
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量子元胞自动机故障检测新技术
量子元胞自动机(QCA)电路是近年来受到广泛关注的新一代纳米技术。本文提出了一种基于QCA的电路卡死故障检测框架。现有的技术和方法不能保证检测出卡滞故障。这项工作的动机是电路的卡在故障测试集不能保证检测到在其QCA实现中可能发生的所有缺陷。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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