Material characterization via phaseless tomography : numerical results in phase retrieval

R. Pierri, G. Leone, R. Bernini
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引用次数: 1

Abstract

The diffraction tomography is a new method in which the complex permittivity profile of an object is reconstructed using algorithms that require the knowledge of both the amplitude and the phase of the scattered field [1-2]. However the difficulty of obtaining the phase of the scattered field at optical frequencies has limited the practical applications of diffraction tomography.
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通过无相层析成像表征材料:相位检索的数值结果
衍射层析成像是一种新的方法,它使用需要同时知道散射场的振幅和相位的算法来重建物体的复介电常数曲线[1-2]。然而,衍射层析成像在光学频率下难以获得散射场的相位,这限制了衍射层析成像的实际应用。
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