Relaxations of metallurgraphy and TEM analysis with-conductivity of aluminum conductor

Abstract

Overhead lines based on aluminum (Al) conductor have been widely used and until date, continuous effort is done to enhance their capability. This paper is discussed about the result of metallurgraphy and transmission electron microscope (TEM) that has been undertaken in Advance Material Research Center (AMREC), SIRIM. This is done to determine differences factors that influence the conductivity value between pure aluminum and. Al alloys grade 6101 that have been improved by their strength. By applying both tests, it will provide us information about the behavior of material used as cable. Because of higher resistance value of Al alloy compared to pure Al, extra changes needed to ensure higher conductivity value achieve thus increase the power transmitted in the conductor.