A New Design of AC Voltage Probe for EMI Conducted Emission Measurement

Abstract

In this paper, we proposed a new design AC voltage probe for EMI AC conduction pretest and debug. This AC voltage probe has a strong positive correlation with the results of LISN. It can be used for the designers and engineers to check if the product can meet the limit of AC conducted noises before the final test. The different type and value capacitors were applied for this probe and the best configuration was found in the study. The proposed structure has been implemented for the conducted emissions measurement from 150 kHz to 30 MHz, which is verified to fulfill the preliminary test of DUT. This probe is simple and useful for AC conduction pretest in the stage of design, and it is also a low-cost and effective tool for EMI AC conduction problems diagnosis and debug.