C. Weil, F. Marler, J. Major, M. Weidman, D. Russell
{"title":"Dual Six-Port Reflectometer Systems Using Waveguide in the Frequency Range 18-50 GHz","authors":"C. Weil, F. Marler, J. Major, M. Weidman, D. Russell","doi":"10.1109/ARFTG.1989.323940","DOIUrl":null,"url":null,"abstract":"The development and evaluation of three dual six-port reflectometer systems, that use WR-42, WR-28 and WR-22 waveguide, is discussed; these cover the frequency range 18-50 GHz. The systems are capable of automated or semi-automated operation and will provide complex scattering parameter data for customer waveguide components, as well as effective efficiency data for power sensors. Some representative measurement data are presented that demonstrate that these systems yield results that do not differ significantly from those obtained using older measurement systems. Some discussion of measurement uncertainties is also included.","PeriodicalId":358927,"journal":{"name":"33rd ARFTG Conference Digest","volume":"16 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"33rd ARFTG Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.1989.323940","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The development and evaluation of three dual six-port reflectometer systems, that use WR-42, WR-28 and WR-22 waveguide, is discussed; these cover the frequency range 18-50 GHz. The systems are capable of automated or semi-automated operation and will provide complex scattering parameter data for customer waveguide components, as well as effective efficiency data for power sensors. Some representative measurement data are presented that demonstrate that these systems yield results that do not differ significantly from those obtained using older measurement systems. Some discussion of measurement uncertainties is also included.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
