Advanced Spherical Near-field Postprocessing Techniques

F. R. Varela, B. Galocha Iragüen, M. S. Castañer
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Abstract

Spherical near-field measurements are regarded as the most accurate antenna testing technique. This accuracy comes with the cost of very strict requirements in terms of near-field sampling density, the measured point distribution, and phase coherence. The fulfillment of such conditions can lead to time-consuming, impractical or expensive measurements. Specially at high frequencies, the required number of points for a successful far-field transformation grows excessively, whereas maintaining a stable phase reference becomes challenging. This paper presents a series of postprocessing techniques which enable to relax these requirements. It is shown how antenna symmetries and a priori knowledge can be exploited to reduce the sampling rate below the Nyquist criterion. In addition, phase coherence can also be avoided by combining measurements in multiple surfaces and proper phase retrieval algorithms. All presented techniques aim to provide faster and cheaper alternatives, while maintaining the accuracy and reliability of near-field spherical measurements.
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先进的球面近场后处理技术
球面近场测量被认为是最精确的天线测试技术。这种精度的代价是在近场采样密度、测量点分布和相位相干性方面有非常严格的要求。满足这些条件可能导致耗时、不切实际或昂贵的测量。特别是在高频率下,成功的远场变换所需的点数过度增加,而保持稳定的相位参考变得具有挑战性。本文提出了一系列的后处理技术,可以放宽这些要求。它显示了如何利用天线对称性和先验知识来降低采样率低于奈奎斯特准则。此外,通过结合多个表面的测量和适当的相位恢复算法,也可以避免相位相干。所有提出的技术都旨在提供更快、更便宜的替代方案,同时保持近场球面测量的准确性和可靠性。
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