{"title":"VCSEL reliability studies at SUN microsystems physical sciences center","authors":"D. Mcelfresh, L. Lopez, R. Melanson, D. Vacar","doi":"10.1109/LEOSST.2004.1338703","DOIUrl":null,"url":null,"abstract":"In this paper, we describe the experiment and review our results to date. Degraded VCSEL arrays have been censored and are currently being subjected to a detailed physical characterization. This analysis will provide a glimpse into the manifestation of VCSEL failures, the mechanisms and physics of emission degradation. Optical interconnects will be required for the bandwidth needs for computing systems in the near future. We have investigated the specific parameters that produce the most reliable VCSELs - the emitter engines for optical interconnects.","PeriodicalId":280347,"journal":{"name":"Digest of the LEOS Summer Topical Meetings Biophotonics/Optical Interconnects and VLSI Photonics/WBM Microcavities, 2004.","volume":"105 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-06-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of the LEOS Summer Topical Meetings Biophotonics/Optical Interconnects and VLSI Photonics/WBM Microcavities, 2004.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/LEOSST.2004.1338703","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
In this paper, we describe the experiment and review our results to date. Degraded VCSEL arrays have been censored and are currently being subjected to a detailed physical characterization. This analysis will provide a glimpse into the manifestation of VCSEL failures, the mechanisms and physics of emission degradation. Optical interconnects will be required for the bandwidth needs for computing systems in the near future. We have investigated the specific parameters that produce the most reliable VCSELs - the emitter engines for optical interconnects.
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