EIS capacitor sensor, with TiO2 dielectric, applied in the evaluation of phosphate in wastewater

Huziel Souto, Fernando Cesar Rufino, Renato Massaroto Beraldo, Sergio Henrique Fernandes, José Alexandre Diniz
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Abstract

This work presents the development of an Electrolyte-Insulator-Semiconductor (EIS) device with a built-in reference electrode to detect phosphate in wastewater. The idea of developing this device comes from the need to improve the use of water processed by the effluent treatment plant. After treatment process, a fraction of the water can be used as wastewater, this water cannot be consumed, however it can be used for other purposes including cleaning public spaces, such as streets and squares. In the fabrication process of the EIS device, titanium oxide (TiO2) deposited on a silicon substrate was used as a sensor element, and titanium nitride (TiN) was used for the reference electrode. Both materials were deposited by the reactive sputtering process. Aluminum (Al) was used for the electrode on the back of the slide deposited by evaporation. Preliminary results of structural and electrical characterizations indicate that the manufactured device has good sensitivity to phosphate ions (66 mV/ppm). This sensitivity is due to the good quality of the film, which is shown using Raman spectroscopy, atomic force microscopy (AFM) and X-ray diffraction (XRD) techniques, in addition to electrical measurements.
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以TiO2为介质的EIS电容传感器应用于废水中磷酸盐的评价
这项工作提出了一种具有内置参考电极的电解质-绝缘体-半导体(EIS)装置的开发,用于检测废水中的磷酸盐。开发这种装置的想法来自于需要改善污水处理厂处理过的水的使用。经过处理后,一小部分水可以作为废水使用,这些水不能被消费,但它可以用于其他目的,包括清洁公共空间,如街道和广场。在EIS器件的制造过程中,采用沉积在硅衬底上的氧化钛(TiO2)作为传感器元件,氮化钛(TiN)作为参比电极。两种材料均采用反应溅射工艺沉积。在蒸发沉积的载玻片背面,电极采用铝(Al)。初步的结构和电学表征结果表明,该器件对磷酸离子(66 mV/ppm)具有良好的灵敏度。这种灵敏度是由于薄膜的良好质量,这是通过拉曼光谱,原子力显微镜(AFM)和x射线衍射(XRD)技术以及电测量显示的。
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来源期刊
Journal of Integrated Circuits and Systems
Journal of Integrated Circuits and Systems Engineering-Electrical and Electronic Engineering
CiteScore
0.90
自引率
0.00%
发文量
39
期刊介绍: This journal will present state-of-art papers on Integrated Circuits and Systems. It is an effort of both Brazilian Microelectronics Society - SBMicro and Brazilian Computer Society - SBC to create a new scientific journal covering Process and Materials, Device and Characterization, Design, Test and CAD of Integrated Circuits and Systems. The Journal of Integrated Circuits and Systems is published through Special Issues on subjects to be defined by the Editorial Board. Special issues will publish selected papers from both Brazilian Societies annual conferences, SBCCI - Symposium on Integrated Circuits and Systems and SBMicro - Symposium on Microelectronics Technology and Devices.
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