Effect of Oxygen Annealing Atmosphere on Structural, Electrical and Energy Storage Properties of Bi0.5Na0.5TiO3 Polycrystalline Thin Film

IF 1.3 Q3 INSTRUMENTS & INSTRUMENTATION Quantum Beam Science Pub Date : 2023-09-20 DOI:10.3390/qubs7030029
Ilham Hamdi Alaoui, Nathalie Lemée, Françoise Le Marrec, Moussa Mebarki, Anna Cantaluppi, Delphine Favry, Abdelilah Lahmar
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Abstract

Bismuth sodium titanate (BNT) thin films were deposited on Pt/SiN substrates by Sol-Gel spin coating technique and annealed under O2 atmosphere. The microstructural, structural, and electrical properties of the obtained film were investigated. Electron microscopy scans and atomic force microscopy micrographs were used to analyze the microstructure of the films. Furthermore, energy-dispersive X-ray spectroscopy (EDX) analysis revealed a Na-deficient composition for the obtained film. X-ray diffraction and Raman spectroscopy allowed the identification of a pure perovskite BNT phase. Dielectric, ferroelectric, and leakage current measurements revealed good frequency stability of the dielectric constant and dielectric losses for BNT thin film. The results are discussed in terms of Na deficiency effects on the defect structure of BNT. Further, the film showed attractive electrostatic energy storage properties with energy density that exceeds 1.04 J/cm3 under E = 630 kV/cm.
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氧退火气氛对Bi0.5Na0.5TiO3多晶薄膜结构、电学和储能性能的影响
采用溶胶-凝胶自旋镀膜技术在Pt/SiN基底上制备了钛酸铋钠(BNT)薄膜,并在O2气氛下进行了退火。研究了薄膜的显微组织、结构和电学性能。利用电子显微镜和原子力显微镜对膜的微观结构进行了分析。此外,能量色散x射线光谱(EDX)分析显示,所获得的薄膜具有na缺陷成分。x射线衍射和拉曼光谱鉴定了纯钙钛矿BNT相。电介质、铁电和漏电流测量表明,BNT薄膜的介电常数和介电损耗具有良好的频率稳定性。讨论了Na缺乏对BNT缺陷结构的影响。此外,在E = 630 kV/cm条件下,薄膜的能量密度超过1.04 J/cm3,具有良好的静电储能性能。
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CiteScore
2.80
自引率
28.60%
发文量
27
审稿时长
11 weeks
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