Jue Wang, L. Wamboldt, Ronald W. Davis, Ying Shi, Todd L. Heck, Craig Ungaro, A. B. Ruffin, Michael D. Thomas
{"title":"Laser-induced damage of dielectric-enhanced surface-modified single-point-diamond-turned Al-6061 multiband mirrors","authors":"Jue Wang, L. Wamboldt, Ronald W. Davis, Ying Shi, Todd L. Heck, Craig Ungaro, A. B. Ruffin, Michael D. Thomas","doi":"10.1117/12.2685665","DOIUrl":null,"url":null,"abstract":"Laser-induced damage threshold (LIDT) tests were performed at 1064 nm and 20 ns. Nodule defects were identified as the LIDT-limiting factor. The results suggest that the scale of the nodules is associated with the size of defects residing on the aluminum substrate surface. 3D finite-difference time-domain (FDTD) simulation was employed to calculate the electric field intensity (EFI) enhancement at the nodular defects with a seed diameter ranging from 0.35 μm to 2.5 μm. A direct linkage between the EFI enhancement and laser-induced damage morphology was established. Additional LIDT tests were conducted on surface modified aluminum substrate by using Corning aluminum process (CAP). The surface modification led to a 10x increase of the LIDT. Finally, LIDT of the multiband mirrors was predicted based on the absorption-driven damage and defect-driven damage. The results suggested that a combination of the CAP-modified Al6061 and low defect deposition process of the dielectric enhanced layers lead to high laser durability.","PeriodicalId":202227,"journal":{"name":"Laser Damage","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2023-11-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Laser Damage","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2685665","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Laser-induced damage threshold (LIDT) tests were performed at 1064 nm and 20 ns. Nodule defects were identified as the LIDT-limiting factor. The results suggest that the scale of the nodules is associated with the size of defects residing on the aluminum substrate surface. 3D finite-difference time-domain (FDTD) simulation was employed to calculate the electric field intensity (EFI) enhancement at the nodular defects with a seed diameter ranging from 0.35 μm to 2.5 μm. A direct linkage between the EFI enhancement and laser-induced damage morphology was established. Additional LIDT tests were conducted on surface modified aluminum substrate by using Corning aluminum process (CAP). The surface modification led to a 10x increase of the LIDT. Finally, LIDT of the multiband mirrors was predicted based on the absorption-driven damage and defect-driven damage. The results suggested that a combination of the CAP-modified Al6061 and low defect deposition process of the dielectric enhanced layers lead to high laser durability.
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