{"title":"Real-time identification of small anomalies from scattering matrix without background information","authors":"Won-Kwang Park","doi":"10.3233/jae-230113","DOIUrl":null,"url":null,"abstract":"Several researches have confirmed the possibility of localizing small anomalies via Kirchhoff migration (KM); however, when the background information is unknown, small anomalies cannot be satisfactorily retrieved. This fact can be examined through the simulation results; however, related theoretical result to explain the reason of such phenomenon has not yet been investigated. In this contribution, we show that the imaging function of the KM can be expressed by an infinite series of the Bessel function of the first kind, material properties, and antenna arrangement, and applied alternative value of the background wavenumber. Based on the theoretical result, we explain why the exact location and shape of anomalies cannot be retrieved. The simulation results with synthetic data exhibited to support the theoretical result.","PeriodicalId":50340,"journal":{"name":"International Journal of Applied Electromagnetics and Mechanics","volume":null,"pages":null},"PeriodicalIF":1.1000,"publicationDate":"2023-11-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Journal of Applied Electromagnetics and Mechanics","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.3233/jae-230113","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Several researches have confirmed the possibility of localizing small anomalies via Kirchhoff migration (KM); however, when the background information is unknown, small anomalies cannot be satisfactorily retrieved. This fact can be examined through the simulation results; however, related theoretical result to explain the reason of such phenomenon has not yet been investigated. In this contribution, we show that the imaging function of the KM can be expressed by an infinite series of the Bessel function of the first kind, material properties, and antenna arrangement, and applied alternative value of the background wavenumber. Based on the theoretical result, we explain why the exact location and shape of anomalies cannot be retrieved. The simulation results with synthetic data exhibited to support the theoretical result.
一些研究已经证实了通过基尔霍夫迁移（KM）定位微小异常的可能性；然而，当背景信息未知时，微小异常无法令人满意地检索出来。这一事实可以通过仿真结果来检验，但解释这种现象原因的相关理论结果尚未得到研究。在本文中，我们证明了 KM 的成像函数可以用贝塞尔函数第一类、材料特性和天线布置的无穷级数来表示，并应用了背景波数的替代值。基于这一理论结果，我们解释了为何无法获取异常点的确切位置和形状。合成数据的仿真结果表明理论结果是正确的。
期刊介绍：
The aim of the International Journal of Applied Electromagnetics and Mechanics is to contribute to intersciences coupling applied electromagnetics, mechanics and materials. The journal also intends to stimulate the further development of current technology in industry. The main subjects covered by the journal are:
Physics and mechanics of electromagnetic materials and devices
Computational electromagnetics in materials and devices
Applications of electromagnetic fields and materials
The three interrelated key subjects – electromagnetics, mechanics and materials - include the following aspects: electromagnetic NDE, electromagnetic machines and devices, electromagnetic materials and structures, electromagnetic fluids, magnetoelastic effects and magnetosolid mechanics, magnetic levitations, electromagnetic propulsion, bioelectromagnetics, and inverse problems in electromagnetics.
The editorial policy is to combine information and experience from both the latest high technology fields and as well as the well-established technologies within applied electromagnetics.
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