Oul Cho, Sujin Park, Hogeun Chang, Jiwhan Kim, Jaekwon Kim, Sungwoo Kim, Taehyung Kim, Jeonghun Kwak
{"title":"Investigation of operation and degradation mechanisms in ZnTeSe blue quantum-dot light-emitting diodes by identifying recombination zone","authors":"Oul Cho, Sujin Park, Hogeun Chang, Jiwhan Kim, Jaekwon Kim, Sungwoo Kim, Taehyung Kim, Jeonghun Kwak","doi":"10.1007/s12274-024-6541-5","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":508036,"journal":{"name":"Nano Research","volume":"2 2","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Nano Research","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/s12274-024-6541-5","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
