{"title":"Study of MgO (111) Charging Phenomena Using Scanning Electron Microscopy and Atomic Force Microscopy","authors":"Aicha Boughariou, Osama Qays Abdullah, Guy Blaise","doi":"10.1134/S1063783423600085","DOIUrl":null,"url":null,"abstract":"<p>In this article we have studied, using the Scanning Electron Microscopy SEM LEO 440, the surface electrical properties of MgO (111) irradiated with 30 keV electrons. The study of the evolution of the secondary electronic emission of MgO (111) shows that <span>\\(\\ln \\sigma \\)</span> increases and reaches a value lower than zero. After an injection of 5000 pC, we observe a pseudo mirror, which is due to a very negative surface potential. Finally, we have shown the very high stability of charges within MgO (111) thanks to the use of Atomic Force Microscopy coupled with Scanning Electron Microscope. We can then conclude that MgO (111) is a good trapping insulator.</p>","PeriodicalId":731,"journal":{"name":"Physics of the Solid State","volume":"66 1","pages":"20 - 23"},"PeriodicalIF":0.9000,"publicationDate":"2024-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Physics of the Solid State","FirstCategoryId":"101","ListUrlMain":"https://link.springer.com/article/10.1134/S1063783423600085","RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"PHYSICS, CONDENSED MATTER","Score":null,"Total":0}
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Abstract
In this article we have studied, using the Scanning Electron Microscopy SEM LEO 440, the surface electrical properties of MgO (111) irradiated with 30 keV electrons. The study of the evolution of the secondary electronic emission of MgO (111) shows that \(\ln \sigma \) increases and reaches a value lower than zero. After an injection of 5000 pC, we observe a pseudo mirror, which is due to a very negative surface potential. Finally, we have shown the very high stability of charges within MgO (111) thanks to the use of Atomic Force Microscopy coupled with Scanning Electron Microscope. We can then conclude that MgO (111) is a good trapping insulator.
摘要 本文使用扫描电子显微镜 SEM LEO 440 研究了用 30 keV 电子辐照的氧化镁（111）的表面电特性。对氧化镁（111）二次电子发射演变的研究表明，\（\ln \sigma \）会增加并达到一个低于零的值。注入 5000 pC 后，我们观察到一个伪镜，这是由于表面电势非常负所致。最后，通过使用原子力显微镜和扫描电子显微镜，我们展示了氧化镁（111）内部电荷的高度稳定性。因此，我们可以得出结论：氧化镁（111）是一种良好的捕获绝缘体。
期刊介绍：
Presents the latest results from Russia’s leading researchers in condensed matter physics at the Russian Academy of Sciences and other prestigious institutions. Covers all areas of solid state physics including solid state optics, solid state acoustics, electronic and vibrational spectra, phase transitions, ferroelectricity, magnetism, and superconductivity. Also presents review papers on the most important problems in solid state physics.
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