My 35 Years in Mixed Methods Research

IF 4.7 3区 材料科学 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC ACS Applied Electronic Materials Pub Date : 2024-05-21 DOI:10.1177/15586898241253892
J. Creswell
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Abstract

I dedicate this paper to my friend and colleague, Mike Fetters, who served as senior co-editor of the Journal of Mixed Methods Research (JMMR). In this paper, I discuss key mixed methods developments over the last 35 years, my fortunate involvement in them, and my collaboration with Mike Fetters in several of them. The discussion focuses on founding leaders of the field, combining quantitative and qualitative research, co-founding JMMR and the Mixed Methods International Research Association, teaching and simplifying mixed methods research, promoting the methodology internationally, assisting external groups in establishing quality standards for the field, and co-founding with Mike Fetters the Michigan Mixed Methods Research Program. This discussion contributes a personal historical perspective about the mixed methods field.
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我从事混合方法研究的 35 年经历
谨以此文献给我的朋友和同事迈克-费特斯(Mike Fetters),他曾担任《混合方法研究期刊》(JMMR)的资深联合编辑。在本文中,我将讨论过去 35 年来混合方法的主要发展、我有幸参与其中的情况,以及我与迈克-费特斯在其中几项发展中的合作。讨论的重点是该领域的创始领导者、定量研究与定性研究的结合、共同创立 JMMR 和混合方法国际研究协会、混合方法研究的教学与简化、在国际上推广该方法、协助外部团体建立该领域的质量标准,以及与 Mike Fetters 共同创立密歇根混合方法研究项目。本讨论从个人的历史角度对混合方法领域进行了阐述。
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来源期刊
CiteScore
7.20
自引率
4.30%
发文量
567
期刊介绍: ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric. Indexed/​Abstracted: Web of Science SCIE Scopus CAS INSPEC Portico
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