{"title":"Prerequisites for Construction of a Device for Measurements of Electric Field Strength with Determination of the Measurement Error","authors":"S. V. Biryukov","doi":"10.1134/S1063784224700336","DOIUrl":null,"url":null,"abstract":"<p>A new solution is proposed for construction of a device for measurement of electric field strength with determination of the measurement error. The device is based on a dual-type sensor, which makes it possible to reduce the error, expand the spatial range of measurement, and instrumentally determine the measurement error from two simultaneous single-point measurements of the field strength obtained with errors of different signs. The ability of the device to instrumentally determine the measurement error is considered for the first time.</p>","PeriodicalId":783,"journal":{"name":"Technical Physics","volume":null,"pages":null},"PeriodicalIF":1.1000,"publicationDate":"2024-06-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Technical Physics","FirstCategoryId":"101","ListUrlMain":"https://link.springer.com/article/10.1134/S1063784224700336","RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"PHYSICS, APPLIED","Score":null,"Total":0}
引用次数: 0
Abstract
A new solution is proposed for construction of a device for measurement of electric field strength with determination of the measurement error. The device is based on a dual-type sensor, which makes it possible to reduce the error, expand the spatial range of measurement, and instrumentally determine the measurement error from two simultaneous single-point measurements of the field strength obtained with errors of different signs. The ability of the device to instrumentally determine the measurement error is considered for the first time.
期刊介绍：
Technical Physics is a journal that contains practical information on all aspects of applied physics, especially instrumentation and measurement techniques. Particular emphasis is put on plasma physics and related fields such as studies of charged particles in electromagnetic fields, synchrotron radiation, electron and ion beams, gas lasers and discharges. Other journal topics are the properties of condensed matter, including semiconductors, superconductors, gases, liquids, and different materials.
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