Ran Hai , Xueyan Wang , Xue Bai , Zhonglin He , Ding Wu , Cong Li , Hongbin Ding , Xuefeng Yao
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引用次数: 0
Abstract
This study investigates the impact of sample temperature Ts on Laser-Induced Breakdown Spectroscopy (LIBS) emission characteristics and Calibration-Free LIBS (CF-LIBS) quantitative analysis in vacuum and air. Using an aluminum‑tin‑copper alloy, we analyze spectral lines within a 20 °C to 170 °C temperature range. Evaluation encompasses emission line intensities, plasma parameters, expansion imagery, and laser ablation crater morphologies. CF-LIBS analysis underlines that elevated Ts maintains quantitative accuracy even for minor elements with weak lines. In atmospheric conditions, tin segregation occurs, yet CF-LIBS remains robust. These results highlight CF-LIBS's potential for varied applications by mitigating Ts-induced effects.
期刊介绍：
Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields:
Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy;
Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS).
Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS).
X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF).
Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.
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