Observing impacts on luminescence depth profile evolutions from surface altered quartzite using OSL laser scanning and controlled light exposed rock sampling techniques

Abstract

A technique for parameterizing rock surfaces for luminescence surface exposure dating involves the use of known age rock surfaces which may host no surficial alterations or weathering rinds. However, exposure dated rock surfaces often host subsurface weathering rinds or foreign surficial components, which may impact the development of luminescence depth profiles in the rock material. To observe any effects of depth profile development and parameterizations of naturally altered rock surfaces, controlled exposure experiments were conducted on surface altered and surface non-altered luminescence saturated quartzite samples from the top and bottom portions of rock surface cores, collected from two erratic members of the Foothills Erratics Train, Alberta. Spatially resolved OSL laser scanning techniques were used to acquire two-dimensional OSL maps of the surface core samples for depth profile generation. Results produced varied intensities of depth profile data scatter and depth profile parameterizations between surface altered and non-altered samples. Several cores which exhibited surface alterations produced lower attenuation coefficients than comparable cores with no surface alterations, possibly from the effects of surface features and weathering rinds attenuating light intensity for OSL stimulation. These trends indicate samples hosting surface alterations such as weathering rinds, lichen cover, and staining may offer parameterizations which are inequivalent to rock surfaces with no surface altered components, and that depth dependent, multi-order parameterizations may be needed to adequately parameterize rock surfaces hosting surface altered features for exposure dating.