Secondary particle intensity for experimental range verification in carbon ion therapy

IF 1.4 3区 物理与天体物理 Q3 INSTRUMENTS & INSTRUMENTATION Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms Pub Date : 2024-07-18 DOI:10.1016/j.nimb.2024.165464
Chuan Huang , Zhiguo Xu , Zulong Zhao , Yongzhi Yin , Xiulin Zhang , Xiyu Qiu , Peng Ma , Haibo Peng
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Abstract

Range uncertainty that reduces the dosimetric advantage of carbon ion therapy is a major problem limiting its treatment precision. To address this issue, high-precision monitoring of the in-beam range is essential. This paper proposes a method for range verification using a secondary particle intensity (SPI) system consisting of a cerium bromide (CeBr3) scintillation detector and an integrated ionization chamber (IC). This method uses the secondary particle intensity produced by the primary particles per monitor unit (MU) observed by the SPI system to convert the carbon ion range. Secondary particles, including gamma rays, neutrons, and charged particles, can be detected in the CeBr3 detector as long as their signal exceeds the threshold, and no discrimination by particle type is required. The Heavy Ion Medical Machine (HIMM) terminal, situated in Lanzhou, China, provided the 12C6+ beam with energies ranging from 160.86 to 211.44 MeV/u. The experiment demonstrated that the carbon ion range accuracy of the 12C6+ beam in a polymethyl methacrylate (PMMA) target can reach 0.92 ± 0.67 mm under a 10 ms measurement period. The secondary particle energy spectrum was recorded during both the in-beam and off-beam phases, clearly recognizing the 511 keV annihilation photopeak with a full width at half maximum (FWHM) of 31.37 keV. The photopeak of annihilation confirmed the accumulation of activated products. During the 15 min continuous irradiation process, the effect of activated product accumulation on the range verification is about 1.15 mm. This paper illustrates the feasibility of SPI method for fast measurement of carbon ion range, which could potentially reduce the effects of range uncertainty in carbon ion therapy.

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用于碳离子疗法实验范围验证的二次粒子强度
范围不确定性降低了碳离子疗法的剂量优势,是限制其治疗精度的一个主要问题。要解决这个问题,必须对束内范围进行高精度监测。本文提出了一种利用由溴化铈(CeBr3)闪烁探测器和集成电离室(IC)组成的二次粒子强度(SPI)系统进行射程验证的方法。这种方法利用 SPI 系统观测到的每个监测器单位(MU)的一次粒子所产生的二次粒子强度来换算碳离子量程。二次粒子,包括伽马射线、中子和带电粒子,只要其信号超过阈值,就能在 CeBr3 检测器中被检测到,而无需根据粒子类型进行区分。位于中国兰州的重离子医用机(HIMM)终端提供了能量范围为 160.86 至 211.44 MeV/u 的 12C6+ 射束。实验证明,在 10 ms 的测量周期内,12C6+ 射束在聚甲基丙烯酸甲酯(PMMA)靶中的碳离子量程精度可达 0.92 ± 0.67 mm。在束内和束外阶段都记录了二次粒子能谱,清楚地识别出 511 keV 的湮灭光斑,其半最大全宽(FWHM)为 31.37 keV。湮灭光峰证实了活化产物的积累。在 15 分钟的连续辐照过程中,活性产物积累对量程验证的影响约为 1.15 毫米。本文说明了用 SPI 方法快速测量碳离子量程的可行性,这种方法有可能减少碳离子治疗中量程不确定性的影响。
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来源期刊
CiteScore
2.80
自引率
7.70%
发文量
231
审稿时长
1.9 months
期刊介绍: Section B of Nuclear Instruments and Methods in Physics Research covers all aspects of the interaction of energetic beams with atoms, molecules and aggregate forms of matter. This includes ion beam analysis and ion beam modification of materials as well as basic data of importance for these studies. Topics of general interest include: atomic collisions in solids, particle channelling, all aspects of collision cascades, the modification of materials by energetic beams, ion implantation, irradiation - induced changes in materials, the physics and chemistry of beam interactions and the analysis of materials by all forms of energetic radiation. Modification by ion, laser and electron beams for the study of electronic materials, metals, ceramics, insulators, polymers and other important and new materials systems are included. Related studies, such as the application of ion beam analysis to biological, archaeological and geological samples as well as applications to solve problems in planetary science are also welcome. Energetic beams of interest include atomic and molecular ions, neutrons, positrons and muons, plasmas directed at surfaces, electron and photon beams, including laser treated surfaces and studies of solids by photon radiation from rotating anodes, synchrotrons, etc. In addition, the interaction between various forms of radiation and radiation-induced deposition processes are relevant.
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