Status of edge electron density and temperature measurements with Helium Beam Emission Spectroscopy (He-BES) on EAST

G. F. Ding, Y. Ye, R. Chen, G.S. Xu, Y. Yu, X. Lin, Q.Q. Yang, W. Zhang, Y. Li, N. Yan, S.C. Liu, L. Wang, T. Zhang, T.F. Zhou, D.G. Wu
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Abstract

Helium Beam Emission Spectroscopy (He-BES) diagnostic has been developed on EAST, which is able to measure the edge electron density and temperature profiles simultaneously using a helium line intensity ratio method. The diagnostic includes the beam injector and the detection system. There are 20 observation channels within an observation range of 80 mm in the detection system at the low filed side, which can cover the whole scrape-off layer (SOL) and part of the pedestal region of EAST. The beam injector system has been upgraded to Supersonic Molecular Beam Injector (SMBI) system to realize deeper helium injection since the 2021 campaign. Four spectral lines at wavelengths of 728.1 nm, 706.5 nm, 667.8 nm and 656.3 nm are detected by the He-BES. The first three spectral lines, including 728.1 nm, 706.5 nm, 667.8 nm, are measured for calculating edge n e and T e profiles based on the collisional-radiative model (CRM) model, and the last spectral line (656.3 nm) is used for the measurement of D α emission. The edge electrostatic fluctuations can be obtained from the power spectrum of D α emission. The electron density and temperature profiles calculated from the 667.8/728.1 and 728.1/706.5 nm line ratios are in good agreement with those from other diagnostics in the edge region of plasma. The self-consistency of He-BES diagnostic is also verified, such as the density pump out caused by LHW and the lower edge temperature caused by the lower heating power.
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利用 EAST 上的氦束发射光谱(He-BES)测量边缘电子密度和温度的情况
在EAST上开发了氦束发射光谱(He-BES)诊断系统,它能够使用氦线强度比方法同时测量边缘电子密度和温度曲线。该诊断仪包括光束注入器和探测系统。探测系统在低滤波侧有20个观测通道,观测范围为80毫米,可覆盖EAST的整个刮除层(SOL)和部分基座区。从2021年开始,光束注入系统升级为超音速分子光束注入系统(SMBI),以实现更深的氦注入。He-BES 探测到波长为 728.1 nm、706.5 nm、667.8 nm 和 656.3 nm 的四条谱线。前三条光谱线(包括 728.1 nm、706.5 nm 和 667.8 nm)用于根据碰撞辐射模型(CRM)计算边缘 n e 和 T e 曲线,最后一条光谱线(656.3 nm)用于测量 D α 发射。边缘静电波动可以从 D α 发射的功率谱中获得。根据 667.8/728.1 和 728.1/706.5 nm 线比计算出的电子密度和温度曲线与等离子体边缘区域的其他诊断结果非常吻合。He-BES 诊断的自洽性也得到了验证,如 LHW 导致的密度泵出和较低加热功率导致的较低边缘温度。
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