Intuitionistic fuzzy approach for reliability analysis of NSP system under time varying failure rates

Abstract

A new approach has been devised to assess the reliability of non-series-parallel (NSP) system, employing intuitionistic fuzzy concept, particularly focusing on triangular intuitionistic fuzzy numbers (TIFNs), alongside the path tracing technique. The system encompasses seven distinct components categorized into three subsystems. Two parallel subsystems each consist of three components connected in series, while the third subsystem involves a single component linked with the extreme components of the parallel subsystems. The failure rates of the components are assumed as time-varying triangular intuitionistic fuzzy numbers. Subsequently, the reliability and Mean Time to System Failure (MTSF) expressions containing both membership and non-membership degrees have been derived utilizing path tracing and (α, β)-cut approach. This methodology is then applied to a Resistor-Inductor-Capacitor (RLC) system, and its intuitionistic fuzzy reliability and MTSF are evaluated. Graphical representations have been utilized to enhance comprehension of the reliability characteristics of the system.