Experimental setup for the determination of spectral normal emissivity of conductive materials in the 1–18 μm wavelength range at 300–1700 °C in air

IF 2 3区 物理与天体物理 Q3 OPTICS Applied Physics B Pub Date : 2024-10-08 DOI:10.1007/s00340-024-08331-9
R. A. Mironov, A. E. Kryukov, A. O. Zabezhaylov, M. O. Zabezhaylov, M. Y. Rusin
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Abstract

This article describes the measurement procedure and data processing features of an apparatus for measuring the spectral emissivity of electrically conductive opaque materials in air. The developed laboratory setup has the following three main features: induction heating of the sample, correction in order to exclude the surrounding radiation reflected by the sample, and the use of multiwavelength pyrometry. Single-sided induction heating of the sample eliminates the contribution of stray radiation from the heating element to the recorded signal. The correction on surrounding radiation increases the accuracy of emissivity determination, especially at low temperatures. The multiwavelength pyrometry is used to obtain the true temperature of a sample. This technique makes it possible to obtain the surface temperature of the sample directly from its thermal radiation spectrum, allowing to examine the material during the oxidation process. The emissivity spectra of zirconium and hafnium diboride samples were measured with the created setup. The obtained spectra reveal several features, which correlate with chemical transformations on the surface of the materials during oxidation.

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在 300-1700 °C 的空气中测定导电材料在 1-18 μm 波长范围内的光谱法向发射率的实验装置
本文介绍了测量空气中导电不透明材料光谱发射率的仪器的测量程序和数据处理功能。所开发的实验室装置具有以下三个主要特点:对样品进行感应加热、为排除样品反射的周围辐射而进行校正,以及使用多波长高温计。样品的单面感应加热消除了加热元件的杂散辐射对记录信号的影响。对周围辐射的修正提高了发射率测定的准确性,尤其是在低温条件下。多波长测温法用于获取样品的真实温度。这项技术可以直接从热辐射光谱中获得样品的表面温度,从而在氧化过程中对材料进行检测。利用创建的装置测量了锆和二硼化铪样品的发射率光谱。获得的光谱显示了几个特征,这些特征与氧化过程中材料表面的化学变化相关。
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来源期刊
Applied Physics B
Applied Physics B 物理-光学
CiteScore
4.00
自引率
4.80%
发文量
202
审稿时长
3.0 months
期刊介绍: Features publication of experimental and theoretical investigations in applied physics Offers invited reviews in addition to regular papers Coverage includes laser physics, linear and nonlinear optics, ultrafast phenomena, photonic devices, optical and laser materials, quantum optics, laser spectroscopy of atoms, molecules and clusters, and more 94% of authors who answered a survey reported that they would definitely publish or probably publish in the journal again Publishing essential research results in two of the most important areas of applied physics, both Applied Physics sections figure among the top most cited journals in this field. In addition to regular papers Applied Physics B: Lasers and Optics features invited reviews. Fields of topical interest are covered by feature issues. The journal also includes a rapid communication section for the speedy publication of important and particularly interesting results.
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