M. M. Tatevosyan, V. G. Vlasenko, A. A. Shiryaeva, T. N. Zhukova
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引用次数: 0
Abstract
The atomic and electronic structures of two organosilicon polymers [–Ph2Si–(C≡C)2–]n (P1) and [–Ph2Si–(C≡C–C≡C)2–]m (P2) (where Ph is a phenyl group) of acetylene and diacetylene types are studied using the methods of density functional theory and X-ray emission spectroscopy. The SiKβ1 X-ray emission spectra of these polymers are interpreted on the basis of analysis of the distribution of partial electronic states obtained from quantum chemical calculations. The quantitative characteristics of the parameters of the chemical interaction of atoms, such as population, natural charges, and electronic configurations in the studied polymers, are obtained on the basis of analysis of hybrid natural bond orbitals. The values of the polarization coefficients of natural bond orbitals indicate the localization of electron density predominantly on carbon atoms. The electronic configurations for carbon atoms in different fragments differ significantly. For the C atoms of ethynyl (diethynyl) fragments, they are close to the linear σ bond of the sp1.03 (P1) and sp0.95 (P2) type, while for the C atoms of phenyl fragments, they are sp2.42, which are intermediate between sp2 and sp3, in accordance with molecular geometry. The natural charges on Si in both polymers are almost the same: +1.58e, +1.59e (e is the elementary charge), while the natural charges for carbon atoms of the diethynyl group decrease in comparison with the charge for the carbon atom of the ethynyl group from –0.42e to –0.36e.
期刊介绍:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.