Field ionization intensity used to measure local pressure in gas flows

IF 3.8 2区 材料科学 Q2 MATERIALS SCIENCE, MULTIDISCIPLINARY Vacuum Pub Date : 2024-10-18 DOI:10.1016/j.vacuum.2024.113728
Felix Sharipov , Irina Graur , Evelyne Salançon
{"title":"Field ionization intensity used to measure local pressure in gas flows","authors":"Felix Sharipov ,&nbsp;Irina Graur ,&nbsp;Evelyne Salançon","doi":"10.1016/j.vacuum.2024.113728","DOIUrl":null,"url":null,"abstract":"<div><div>A coaxial ion source produces an ion beam via field effect in a gas flow through a coaxial microchannel structure. Measuring the intensity of ion emission under an electric voltage condition reveals the pressure at the tip of the coaxial structure, where ionization occurs. The spatial resolution of the measurements is defined by the volume into which the position of the tip fits, here estimated as a cube with an edge of 10 <span><math><mi>μ</mi></math></span>m. The pressure at the tip is also obtained analytically as a function of the throughput through the coaxial structure. The theoretical and experimental pressure values reported in the present work are in agreement between them within the geometric uncertainties of the coaxial structure itself.</div></div>","PeriodicalId":23559,"journal":{"name":"Vacuum","volume":"231 ","pages":"Article 113728"},"PeriodicalIF":3.8000,"publicationDate":"2024-10-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Vacuum","FirstCategoryId":"88","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0042207X24007747","RegionNum":2,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0

Abstract

A coaxial ion source produces an ion beam via field effect in a gas flow through a coaxial microchannel structure. Measuring the intensity of ion emission under an electric voltage condition reveals the pressure at the tip of the coaxial structure, where ionization occurs. The spatial resolution of the measurements is defined by the volume into which the position of the tip fits, here estimated as a cube with an edge of 10 μm. The pressure at the tip is also obtained analytically as a function of the throughput through the coaxial structure. The theoretical and experimental pressure values reported in the present work are in agreement between them within the geometric uncertainties of the coaxial structure itself.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
用于测量气体流中局部压力的场电离强度
同轴离子源通过气体流经同轴微通道结构时的场效应产生离子束。在电压条件下测量离子发射的强度,可以显示发生电离的同轴结构顶端的压力。测量的空间分辨率由尖端位置所适合的体积决定,这里估计为边缘为 10 μm 的立方体。针尖处的压力也是通过分析获得的,是通过同轴结构的吞吐量的函数。在同轴结构本身的几何不确定性范围内,本研究中报告的理论和实验压力值是一致的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
Vacuum
Vacuum 工程技术-材料科学:综合
CiteScore
6.80
自引率
17.50%
发文量
0
审稿时长
34 days
期刊介绍: Vacuum is an international rapid publications journal with a focus on short communication. All papers are peer-reviewed, with the review process for short communication geared towards very fast turnaround times. The journal also published full research papers, thematic issues and selected papers from leading conferences. A report in Vacuum should represent a major advance in an area that involves a controlled environment at pressures of one atmosphere or below. The scope of the journal includes: 1. Vacuum; original developments in vacuum pumping and instrumentation, vacuum measurement, vacuum gas dynamics, gas-surface interactions, surface treatment for UHV applications and low outgassing, vacuum melting, sintering, and vacuum metrology. Technology and solutions for large-scale facilities (e.g., particle accelerators and fusion devices). New instrumentation ( e.g., detectors and electron microscopes). 2. Plasma science; advances in PVD, CVD, plasma-assisted CVD, ion sources, deposition processes and analysis. 3. Surface science; surface engineering, surface chemistry, surface analysis, crystal growth, ion-surface interactions and etching, nanometer-scale processing, surface modification. 4. Materials science; novel functional or structural materials. Metals, ceramics, and polymers. Experiments, simulations, and modelling for understanding structure-property relationships. Thin films and coatings. Nanostructures and ion implantation.
期刊最新文献
Editorial Board and Vacuum units Synthesis and irradiation behavior of (Gd0.2Sm0.2Dy0.2Er0.2Yb0.2)2Ti2O7 high-entropy pyrochlore waste forms consolidated by spark plasma sintering Effect of cumulative plastic deformation on microstructure and strengthening mechanism of extruded Al-Zn-Mg-Cu alloy Exploring the edge effect of single crystal silicon in nanoindentation with two indenters: A molecular dynamics investigation Photocurrent and electrical properties of SiGe nanocrystals grown on insulator via solid-state dewetting of Ge/SOI for Photodetection and solar cells applications
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1