{"title":"Analysis of Interruption Performance of DC Vacuum Circuit Breaker Under Field and Circuitry Coupling in Electromechanical System","authors":"Xiaoming Liu;Hongfei Shi;Hai Chen","doi":"10.1109/TASC.2024.3456485","DOIUrl":null,"url":null,"abstract":"The main factors affecting the fault interruption capability of an active DC vacuum circuit breaker are the structural parameters of the contact surface of the vacuum interrupter, the gap distance at current zero point and the parameters of the commutation circuitry. This paper takes 10 kV/5 kA DC vacuum circuit breaker as the research object, establishes the sheath development model under the coupling of multiple fields and circuitry, and parameterizes the post-arc dielectric recovery strength under the influence of electromechanical parameters. Moreover, the criterion for post-arc re-breakdown is proposed and the limit of breaking current threshold is obtained under the influence of multiple factors.","PeriodicalId":13104,"journal":{"name":"IEEE Transactions on Applied Superconductivity","volume":"34 8","pages":"1-4"},"PeriodicalIF":1.7000,"publicationDate":"2024-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Applied Superconductivity","FirstCategoryId":"101","ListUrlMain":"https://ieeexplore.ieee.org/document/10693295/","RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
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Abstract
The main factors affecting the fault interruption capability of an active DC vacuum circuit breaker are the structural parameters of the contact surface of the vacuum interrupter, the gap distance at current zero point and the parameters of the commutation circuitry. This paper takes 10 kV/5 kA DC vacuum circuit breaker as the research object, establishes the sheath development model under the coupling of multiple fields and circuitry, and parameterizes the post-arc dielectric recovery strength under the influence of electromechanical parameters. Moreover, the criterion for post-arc re-breakdown is proposed and the limit of breaking current threshold is obtained under the influence of multiple factors.
影响有源直流真空断路器故障分断能力的主要因素是真空灭弧室接触面的结构参数、电流零点的间隙距离和换向电路的参数。本文以 10 kV/5 kA 直流真空断路器为研究对象，建立了多场与电路耦合下的护套发展模型，并对机电参数影响下的弧后介质恢复强度进行了参数化。此外，还提出了弧后再击穿判据，并得出了多因素影响下的极限分断电流阈值。
期刊介绍：
IEEE Transactions on Applied Superconductivity (TAS) contains articles on the applications of superconductivity and other relevant technology. Electronic applications include analog and digital circuits employing thin films and active devices such as Josephson junctions. Large scale applications include magnets for power applications such as motors and generators, for magnetic resonance, for accelerators, and cable applications such as power transmission.
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