Precise subpixel luminance extraction method for De-Mura of AMOLED displays

Abstract

Currently, Mura defects have a significant impact on the yield of AMOLED panels, and De-Mura plays a critical role in the compensation. To enhance the applicability of the subpixel luminance extraction method in De-Mura and to address inaccuracies caused by aperture diffraction limit and geometric defocusing in camera imaging, this paper proposes a precise extraction method based on effective area. We establish the concept of the effective area first and then determine the effective area of subpixel imaging on the camera sensor by incorporating the circle of confusion (CoC) caused by aperture diffraction limits and geometric defocusing. Finally, more precise luminance information is obtained. Results show that, after compensation, the Mura on the white screen is almost eliminated subjectively. Objectively, by constructing normalized luminance curves for subpixels in Mura regions, the standard deviation indicates that our method outperforms the traditional whole-pixel method, improving uniformity by approximately 50%.