Relativistic EELS scattering cross-sections for microanalysis based on Dirac solutions.

IF 2.1 3区 工程技术 Q2 MICROSCOPY Ultramicroscopy Pub Date : 2024-12-02 DOI:10.1016/j.ultramic.2024.114083
Zezhong Zhang, Ivan Lobato, Hamish Brown, Dirk Lamoen, Daen Jannis, Johan Verbeeck, Sandra Van Aert, Peter D Nellist
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引用次数: 0

Abstract

The rich information of electron energy-loss spectroscopy (EELS) comes from the complex inelastic scattering process whereby fast electrons transfer energy and momentum to atoms, exciting bound electrons from their ground states to higher unoccupied states. To quantify EELS, the common practice is to compare the cross-sections integrated within an energy window or fit the observed spectrum with theoretical differential cross-sections calculated from a generalized oscillator strength (GOS) database with experimental parameters. The previous Hartree-Fock-based and DFT-based GOS are calculated from Schrödinger's solution of atomic orbitals, which does not include the full relativistic effects. Here, we attempt to go beyond the limitations of the Schrödinger solution in the GOS tabulation by including the full relativistic effects using the Dirac equation within the local density approximation, which is particularly important for core-shell electrons of heavy elements with strong spin-orbit coupling. This has been done for all elements in the periodic table (up to Z = 118) for all possible excitation edges using modern computing capabilities and parallelization algorithms. The relativistic effects of fast incoming electrons were included to calculate cross-sections that are specific to the acceleration voltage. We make these tabulated GOS available under an open-source license to the benefit of both academic users and to allow integration into commercial solutions.

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来源期刊
Ultramicroscopy
Ultramicroscopy 工程技术-显微镜技术
CiteScore
4.60
自引率
13.60%
发文量
117
审稿时长
5.3 months
期刊介绍: Ultramicroscopy is an established journal that provides a forum for the publication of original research papers, invited reviews and rapid communications. The scope of Ultramicroscopy is to describe advances in instrumentation, methods and theory related to all modes of microscopical imaging, diffraction and spectroscopy in the life and physical sciences.
期刊最新文献
State-of-the-art electron beams for compact tools of ultrafast science. Workflow automation of SEM acquisitions and feature tracking. Enhancing subsurface imaging in ultrasonic atomic force microscopy with optimized contact force. Improved precision and accuracy of electron energy-loss spectroscopy quantification via fine structure fitting with constrained optimization. Relativistic EELS scattering cross-sections for microanalysis based on Dirac solutions.
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