Improved precision and accuracy of electron energy-loss spectroscopy quantification via fine structure fitting with constrained optimization.

IF 2.1 3区 工程技术 Q2 MICROSCOPY Ultramicroscopy Pub Date : 2024-12-05 DOI:10.1016/j.ultramic.2024.114084
Daen Jannis, Wouter Van den Broek, Zezhong Zhang, Sandra Van Aert, Jo Verbeeck
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引用次数: 0

Abstract

By working out the Bethe sum rule, a boundary condition that takes the form of a linear equality is derived for the fine structure observed in ionization edges present in electron energy-loss spectra. This condition is subsequently used as a constraint in the estimation process of the elemental abundances, demonstrating starkly improved precision and accuracy and reduced sensitivity to the number of model parameters. Furthermore, the fine structure is reliably extracted from the spectra in an automated way, thus providing critical information on the sample's electronic properties that is hard or impossible to obtain otherwise. Since this approach allows dispensing with the need for user-provided input, a potential source of bias is prevented.

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来源期刊
Ultramicroscopy
Ultramicroscopy 工程技术-显微镜技术
CiteScore
4.60
自引率
13.60%
发文量
117
审稿时长
5.3 months
期刊介绍: Ultramicroscopy is an established journal that provides a forum for the publication of original research papers, invited reviews and rapid communications. The scope of Ultramicroscopy is to describe advances in instrumentation, methods and theory related to all modes of microscopical imaging, diffraction and spectroscopy in the life and physical sciences.
期刊最新文献
State-of-the-art electron beams for compact tools of ultrafast science. Workflow automation of SEM acquisitions and feature tracking. Enhancing subsurface imaging in ultrasonic atomic force microscopy with optimized contact force. Improved precision and accuracy of electron energy-loss spectroscopy quantification via fine structure fitting with constrained optimization. Relativistic EELS scattering cross-sections for microanalysis based on Dirac solutions.
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